TSRI - Taiwan Semiconductor Research Institute

Electronic Measurement Service

Service description

We provide advanced electronic measurement services including verification of ultra-high frequency to THz devices and circuits, analysis of electrical properties at an ultra-low current, ultra-high voltage and current testing of power devices, and other key measurement technologies to promote research and innovation of advanced technologies and innovative applications among relevant domestic teams.

Services

High-frequency circuit and antenna measurement services
High-frequency device measurement service
Nano device and power device measurement services

IC Design and Measurement Service

Service description

To provide system-level IC measurement services for industry and academia, TSRI integrates the semiconductor fabrication, chip design and measurement technologies. And the one-stop service for the integration of devices, and circuits to systems is promoted to accelerate the measurement of chip characterization and verification of system function.

Services

Chip packaging, wire bonding, flip chip assembly
MEMS measurement service
SOC measurement service
Advanced analog IC measurement service
Wideband modulation measurement service
High-speed digital circuit measurement service
Power integrity and signal integrity analysis and measurement services

Materials Analysis

Service description

Our laboratory provides high quality material analysis and testing services, talent training, and research and development of advanced testing technologies and methods. In addition to services for single machines of main equipment, the laboratory provides integrated analysis services and offers comprehensive analysis results in a short time. The Material Analysis Metrology Laboratory has passed accreditation by the Taiwan Accreditation Foundation and attained authentication of ISO17025 testing and calibration laboratories. The testing capacity of the laboratory has reached international levels. The laboratory possesses technology levels comparable to that of other laboratories accredited by 81 accreditation agencies in 67 countries globally.

Services

Scanning Image Techniques : atomic force microscope(AFM), scanning capacitance microscopy (SCM), scanning tunneling microscope(C-AFM), scanning electron microscopy (SEM).
Compositional Techniques: secondary ion mass spectroscopy (SIMS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), Micro Fourier-transform infrared spectroscopy (Micro-FTIR).
Structural Diffraction Techniques: : transmission electron microscopy (TEM), X-ray diffraction analysis (XRD), Electron Back Scatter Diffraction(EBSD).